| 1 | Semiconductor Technology, Conductors–Insulators–Semiconductors, Doped Materials, P-type and N-type Materials |
| 2 | PN Junction and Diode Structure, Forward and Reverse Biasing in Diodes |
| 3 | DC Circuit Diode Analysis and Application Solutions |
| 4 | AC and DC Signals, Properties of AC Signals, Diodes in AC Circuits |
| 5 | Applications of Diodes, Rectifier Circuits, Clipper Circuits, Clamping Circuits |
| 6 | Zener Diodes, Transistors, Current Relationships in Transistors |
| 7 | DC Biasing of Transistors |
| 8 | Measurement and Instrument Principles, Fundamental and Derived Quantities, Important Electrical Unit Standards, Measurement Errors and Statistical Analysis of Errors, Instrument Rating Specifications |
| 9 | Midterm Exam |
| 10 | DC Measurements, DC Ammeters, Current Measurement Experiments with Ammeters, Kirchhoff’s Current Law Experiment |
| 11 | DC Measurements, DC Voltmeters, Ohmmeters, Voltage Measurement Experiment with a Voltmeter, Kirchhoff’s Voltage Law Experiment, Ohm’s Law Experiment, Resistance Measurement Experiment with an Ohmmeter |
| 12 | Measurement of Circuit Components, Semiconductor Integrity Tests, Related Experiments |
| 13 | Power Measurements, Alternating Current Measurements, Related Experiments |
| 14 | Oscilloscope Measurements |